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dc.contributor.authorBabout, Laurent
dc.contributor.authorJopek, Łukasz
dc.contributor.authorJanaszewski, Marcin
dc.contributor.authorPreuss, Michael
dc.contributor.authorBuffiere, Jean-Yves
dc.date.accessioned2015-06-03T11:14:45Z
dc.date.available2015-06-03T11:14:45Z
dc.date.issued2009
dc.identifier.citationZeszyty Naukowe Politechniki Łódzkiej. Elektryka., 2009 z.114 Spec. s.181-187
dc.identifier.issn0374-4817
dc.identifier.otherP-2090
dc.identifier.other0000024674
dc.identifier.otherW serii gł. nr 1023.
dc.identifier.urihttp://hdl.handle.net/11652/363
dc.description.abstractA texture segmentation algorithm which combines grey level intensity from 2 images after discrete wavelet transform and variance has been applied on 2D images to segment lamellar colonies in (α+β) titanium alloy Ti6A14V. Images were acquired using both optical microscope and X-ray tomography. The results are satisfying for the former technique and encouraging for the latter one. Possible extension of the method to volumetric data is presented.en_EN
dc.formatapplication/pdf
dc.language.isoen
dc.publisherPolitechnika Łódzka
dc.titleWavelet-based texture segmentation of titanium based alloy lamellar microstructure: application to images from optical microscope and X-ray microtomography
dc.typeArtykuł


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