Babout, LaurentJopek, ŁukaszJanaszewski, MarcinPreuss, MichaelBuffiere, Jean-Yves2015-06-032015-06-032009Zeszyty Naukowe Politechniki Łódzkiej. Elektryka., 2009 z.114 Spec. s.181-1870374-4817P-20900000024674W serii gł. nr 1023.http://hdl.handle.net/11652/363A texture segmentation algorithm which combines grey level intensity from 2 images after discrete wavelet transform and variance has been applied on 2D images to segment lamellar colonies in (α+β) titanium alloy Ti6A14V. Images were acquired using both optical microscope and X-ray tomography. The results are satisfying for the former technique and encouraging for the latter one. Possible extension of the method to volumetric data is presented.application/pdfenArtykuł