(Wydawnictwo Politechniki Łódzkiej, 2016) Kania, Sylwester; Kuliński, Janusz
We present a calculation method for elimination of the effect
of the RC constant of the measuring circuit in the time-of-flight
(TOF) measurements where a pulse generation of the photocurrent
in a thin layer of low-molecular organic material is exploited.
Presented method allows to eliminate the influence of the
component of displacement current related to dielectric losses and
obtaining the actual conduction current time dependence. The
method was tested on the thin layers of 1,5-dihydroxynaphthalene.
